We're excited to share that Kratos Analytical Ltd are Silver sponsors of the European Conference on Surface and Interface Analysis and it's going to be a busy week.  


Our oral presentations at the meeting include:

• Battery Analysis with High-Resolution and High-Throughput XPS.
• Understanding the fundamentals for A.I. interpretation of X-ray photoelectron spectra.
• Angle resolved XPS depth profiling for extreme ultraviolet lithography optics research- monoatomic vs cluster ion source. (presented by Shriparna Mukherjee, TNO, Netherlands)

If you're attending the conference, visit our booth during the exhibition for a live demonstration of the AXIS Supra+ photoelectron spectrometer by one of our Applications Specialists.  Learn more about how our instrument's automation and market-leading performance can contribute to your materials analysis.  You'll also have the opportunity to meet Kratos colleagues from the Sales and R&D groups. 

In collaboration with Spectral, and IonToF, we are hosting a free to attend Introduction to surface analysis techniques workshop at Chalmers University of Technology on Wednesday afternoon.  It is aimed at materials scientists who would like to learn more about how surface analysis techniques can contribute to their research.  You do not have to be registered for the ECASIA conference to attend this workshop, so If you or any colleagues would like to come along, contact us for more details.

And finally, if you're a User of a Kratos spectrometer, you're warmly invited to our Customer Social event on Tuesday 11th June.  Please contact us for more details if you would like to attend.

We look forward to seeing you at ECASIA.